Dinah Mitsu click burn-in system of the semiconductor integrated circuit

摘要

PURPOSE:To facilitate handling at the time of a change of objects of a test and to improve operativity by forming a semiconductor integrated circuit as a logical operation circuit mounting a similar constitution which has the same software, and making a comparison and detecting a defect. CONSTITUTION:Printed boards TPi(i=1-16) for a test where semiconductor integrated circuits to be tested are mounted and a printed board Mpi where a reference semiconductor integrated circuit is mounted are set in a burn-in tank. One bit of a data output port provided to the CPU 21 of a circuit TCn(n=1-16) to be tested is connected to the error detecting circuit ECi of a printed board MPi through a connector. The printed board MPi, on the other hand, outputs a reset signal to the CPU 21 of the circuit TCn to be tested, which starts the same predetermined processing at the same time and outputs data based upon the processing almost at the same time. Therefore, if a defect of any semiconductor integrated circuit is caused, the defect of the integrated circuit is detected from a difference among data outputted by logical operation circuits.