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InP/InGaAs Monolithic Integrated Demultiplexer, Photodetector, and Heterojunction Bipolar Transistor

机译:InP / InGaAs单片集成解复用器,光电检测器和异质结双极晶体管

摘要

The present invention relates to a monolithic integrated demultiplexing photoreceiver (10) that is formed on a semi-insulating InP substrate(16). A frequency routing device (11) is formed on the substrate and includes a first plurality of InP/InGaAs semiconductor layers. At least one p-i-n photodiode (12) is also formed on the substrate and includes a second plurality of InP/InGaAs semiconductor layers. Additionally, at least one single heterostructure bipolar transistor (18) is formed on the substrate and includes a third plurality of InP/InGaAs semiconductor layers. At least one layer from each of the first, second and third plurality of layers are substantially identical to one another. IMAGE
机译:本发明涉及在半绝缘的InP衬底(16)上形成的单片集成多路分解光接收器(10)。频率路由装置(11)形成在基板上并且包括第一多个InP / InGaAs半导体层。至少一个p-i-n光电二极管(12)也形成在基板上,并且包括第二多个InP / InGaAs半导体层。另外,在衬底上形成至少一个单异质结构双极晶体管(18),并包括第三多个InP / InGaAs半导体层。第一,第二和第三多层中的每一层中的至少一层基本上彼此相同。 <图像>

著录项

  • 公开/公告号CA2181846A1

    专利类型

  • 公开/公告日1997-02-15

    原文格式PDF

  • 申请/专利权人 AT&T IPM CORP.;

    申请/专利号CA19962181846

  • 发明设计人 CHANDRASEKHAR S.;

    申请日1996-07-23

  • 分类号H04J14/02;H04B10/148;

  • 国家 CA

  • 入库时间 2022-08-22 03:23:39

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