Probe for atomic force microscope, method of fabricating same, and atomic force microscope

摘要

An AFM (atomic force microscope) probe having a sharpened probe tip is fabricated by a simple fabrication method.;A probe whose tip is formed by crystal planes of a piezoelectric crystal substrate is offered. Also, a probe whose tip is formed by an isotropic method is proposed. Furthermore, methods of fabricating these probes are offered. Moreover, scanning atomic force microscopes are constructed, using these probes.