首页> 外国专利> Apparatus and method for achieving a repeatable temperature versus time profile for a plasma-heated interaction portion used in mass-produced plasma processing

Apparatus and method for achieving a repeatable temperature versus time profile for a plasma-heated interaction portion used in mass-produced plasma processing

机译:用于批量生产的等离子处理中使用的等离子加热相互作用部分实现可重复的温度-时间曲线的设备和方法

摘要

In a high density plasma (HDP) etching system, the temperature of the cleanser emissive kit portion is raised or approximated to the respective steady state equilibrium temperature so that the detergent chemistry characteristics and rate are substantially the same on the wafer-to-wafer basis. A relatively inactive humidification plasma is excited in the HDP chamber during the idle time period that occurs before or during the execution of a given plasma processing recipe to raise the temperature of the chamber interior kit portion.
机译:在高密度等离子体(HDP)蚀刻系统中,清洁剂发射套件部分的温度升高或接近各自的稳态平衡温度,因此在晶片之间,洗涤剂化学特性和速率基本相同。在执行给定等离子体处理配方之前或期间发生的空闲时间段内,HDP腔室中会激发相对不活跃的加湿等离子体,以提高腔室内部套件部分的温度。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号