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Hermetic sample support for X-ray diffraction analysis

机译:密封样品支持X射线衍射分析

摘要

The present invention relates to a hermetic sample support for X-ray diffraction analysis.;More specifically, the present invention relates to a hermetically sealed sample support for X-ray diffraction which can perform X-ray diffraction analysis with high accuracy by sealing the sample for X-ray diffraction analysis from the atmosphere.;The sealed sample support for X-ray diffraction analysis of the present invention is one surface is open and the other side is the sample support plate 22 formed with a sample support portion 22 is formed in the upper center sample support plate 20 for supporting the sample; A strip-shaped front window 31 is cut in the left and right sides of the barrier support 33 in the center of the semi-cylindrical surface, and the front window 31 is blocked by the barrier film 32. A sample support plate cover (30) for sealing a sample on the sample support plate (20) which is formed with the through hole (34) from the outside atmosphere; And a sample support plate cover 30 for sealing the sample on the sample support plate 20 described above from the outside atmosphere. And fixing means 40 for fixing the cover 30 to the sample support plate 20 described above.
机译:本发明涉及用于X射线衍射分析的气密样品支架。更具体地,本发明涉及一种用于X射线衍射的气密密封样品支架,其可以通过密封样品而以高精度进行X射线衍射分析。用于大气中的X射线衍射分析。本发明的用于X射线衍射分析的密封样品支架的一个表面是敞开的,另一侧是形成有样品支架部分22的样品支架板22。上中央样品支撑板20,用于支撑样品。在半圆柱形表面的中心处的屏障支撑件33的左侧和右侧切有条形的前窗31,并且前窗31被屏障膜32阻挡。样品支撑板盖(30 )用于从外部大气将样品密封在形成有通孔(34)的样品支撑板(20)上;以及用于从外部大气密封上述样本支撑板20上的样本的样本支撑板盖30。固定装置40,用于将盖30固定到上述样品支撑板20上。

著录项

  • 公开/公告号KR970028615A

    专利类型

  • 公开/公告日1997-06-24

    原文格式PDF

  • 申请/专利权人 양승택;

    申请/专利号KR19950042594

  • 发明设计人 이춘수;백종태;조문호;박형호;

    申请日1995-11-21

  • 分类号G01T7/00;

  • 国家 KR

  • 入库时间 2022-08-22 03:17:29

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