首页> 外国专利> A high frequency power applying apparatus, a plasma generating apparatus, a plasma processing apparatus, a high frequency power applying method, a plasma generating method, and a plasma processing method

A high frequency power applying apparatus, a plasma generating apparatus, a plasma processing apparatus, a high frequency power applying method, a plasma generating method, and a plasma processing method

机译:高频功率施加设备,等离子体产生设备,等离子体处理设备,高频功率施加方法,等离子体产生方法和等离子体处理方法

摘要

A plasma processing apparatus is capable of generating a plasma under a high degree of vacuum even when a high frequency power with a high frequency is applied to the plasma processing apparatus so that plasma processing with high uniformity and low degree of damage can be performed with high accuracy And a lower electrode 12 for holding the object 13 is provided at the bottom of the chamber 10A with an insulator 11 interposed therebetween. The first high frequency power source 14 applies a high frequency power to the multi spiral coil 15A through the impedance matcher 16A and the four spiral coil portions 15a are connected in parallel. The length of each coil portion 15a is 1/4 of the wavelength of the high-frequency power supplied from the first high-frequency power supply 14. The second high frequency power supply 17 applies a high frequency bias voltage to the lower electrode 12.
机译:即使将高频功率的高频功率施加到等离子体处理设备,等离子体处理设备也能够在高真空度下产生等离子体,从而能够以高的均匀度和低损伤程度进行等离子体处理。精度并且用于保持物体13的下部电极12在腔室10A的底部设置有绝缘体11。第一高频电源14通过阻抗匹配器16A向多螺旋线圈15A施加高频功率,并且四个螺旋线圈部分15a并联连接。每个线圈部分15a的长度是从第一高频电源14供应的高频电源的波长的1/4。第二高频电源17向下部电极12施加高频偏置电压。

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