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METHOD OF FORMING CVD FILM AND HOT-WALL SINGLE WAFER PROCESSING LOW-PRESSURE CVD APPARATUS

机译:形成CVD膜和热壁单晶片的低压CVD装置的形成方法

摘要

PROBLEM TO BE SOLVED: To provide a method of forming CVD film and apparatus for forming CVD film, improved to avoid producing particles, without lowering the throughput. ;SOLUTION: This low-pressure CVD apparatus 10 comprises two reactor chambers 12A, B, load lock chambers 18A, B housing cassettes 16 as a front and back chambers of the reactor chambers 12, tweezers 20 and carrier chamber 22 for carrying wafers in spaces between load lock chambers 18A, B and reactor chambers 12. The load lock chambers 18A, B have heaters 29 for heating the wafers up to a film-forming temp. during evacuating of the chambers and heaters 28 disposed on the tops, sides and bottoms of the reaction chambers 12 and carrier chamber 22 for keeping the wafers at the film-forming temp.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:提供一种形成CVD膜的方法和用于形成CVD膜的设备,其被改进以避免在不降低产量的情况下避免产生颗粒。解决方案:该低压CVD装置10包括两个反应器室12A,B,装载锁定室18A,B,容纳盒16作为反应器室12的前室和后室,镊子20和承载室22用于在空间中运送晶片在负载锁定室18A,B和反应室12之间。负载锁定室18A,B具有加热器29,用于将晶片加热到成膜温度。在抽空设置在反应室12和承载室22的顶部,侧面和底部的室和加热器28以保持晶片处于成膜温度时; COPYRIGHT:(C)1998,JPO

著录项

  • 公开/公告号JPH10199870A

    专利类型

  • 公开/公告日1998-07-31

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19970001032

  • 发明设计人 FUJITA SHIGERU;

    申请日1997-01-08

  • 分类号H01L21/31;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-22 03:04:59

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