METHOD AND EQUIPMENT FOR PROCESSING VARIABLE DATA WORD WIDTH AND ARRAY DEPTH

摘要

PROBLEM TO BE SOLVED: To provide a method and an equipment for processing the variable data word width and the array depth in the self test of a plurality of arrays using a single controller. SOLUTION: Each memory array 30 has specified row and column address depths and a data word depth, and is provided with scan registers 31, 38. A controller 20 generates a test data word 50 of a generally used length which is delivered to the scan register 3 of each memory array. The test data word 50 of general length has a maximum row address depth, a maximum column address depth, and/or a length dependent on the maximum data word width. A part of a test data word exceeding the column address depth, the row address depth, and/or the data word width is shifted off the end of a scan register in a specific memory array.