Method and apparatus for processing variable data word width and array depth in a serial shared ABIST scheme

摘要

METHOD AND APPARATUS FOR PROVIDING VARIABLE DATA WORD WIDTH AND ARRIC DEPTH IN A SERIAL SHARED ABIST METHOD br br br Patents-stay tuned to the technology METHOD AND APPARATUS FOR PROVIDING VARIABLE DATA WORD WIDTH AND ARRAY DEPTH IN A SERIAL SHARED ABIST METHOD Document Type and Number: To a method and apparatus for processing variable data word width and array depth. Each array includes a given row and column address depth and a data word width. Each array also includes a scan register. A generic test data word is generated and sent to the scan registers of each array. The universal length check data word has a different length depending on the maximum row address depth, the maximum column address depth, and / or the maximum data word width. A portion of the test data word over the column address depth, row address depth and / or data word width of a particular array is shifted beyond the endpoints of the scan registers of a particular array.