METHOD AND APPARATUS FOR HANDLING VARIABLE DATA WORD WIDTHS AND ARRAY DEPTHS IN SERIAL SHARED ABIST SCHEME

摘要

Method and apparatus for processing variable data word width and array depth in serial shared ABIST scheme;To handle variable data word width and array depth in an array built-in self-test system for testing multiple memory arrays using a single controller A method and apparatus are disclosed. Each array includes a predetermined row and column address depth and data word width. Each array also includes a scan register. A general purpose check data word is generated and sent to the scan register of each array. The general length check data word has a length that depends on the maximum row address depth, the maximum column address depth, and / or the maximum data word width. The portion of the check data word beyond the column address depth, row address depth, and / or data word width of the particular array is shifted beyond the endpoint of the scan register of the particular array.