TEST GENERATING DEVICE AND TEST GENERATING METHOD

摘要

PROBLEM TO BE SOLVED: To improve test generating efficiency by executing, in addition to a failure simulation corresponding to every generation of test, a failure simulation to the pattern converted to a shift pattern. ;SOLUTION: A test generating device 10 is formed of a test generating routine 2, a failure simulation routine 3, and a shift pattern converting routine 4. A generated test pattern is used for failure simulation, and the result is accumulated in a failure detection information data base 8 of each node. This pattern is converted to a shift pattern, accumulated in a test pattern data base 11, and used for failure simulation, and the result is accumulated in the data base 8. All detectable failures in a circuit are compared with the data base 8, and when a failure non-detected node is present, the procedure is repeated from the first, and when it is absent, the test patterns accumulated in the data base 11 are collected to form a final test pattern 9. Thus, the number of failures detectable with the same pattern is increased.;COPYRIGHT: (C)1997,JPO