首页> 外国专利> METHOD FOR ADJUSTING LASER BEAM OR ELECTRON BEAM IRRADIATING POSITION, DUST PARTICLE DETECTOR, SCANNING ELECTRON MICROSCOPE AND DUST PARTICLE ANALYZER EMPLOYING LASER BEAM

METHOD FOR ADJUSTING LASER BEAM OR ELECTRON BEAM IRRADIATING POSITION, DUST PARTICLE DETECTOR, SCANNING ELECTRON MICROSCOPE AND DUST PARTICLE ANALYZER EMPLOYING LASER BEAM

机译:调整激光束或电子束辐照位置,粉尘颗粒检测器,扫描电子显微镜和粉尘颗粒分析仪的方法

摘要

PROBLEM TO BE SOLVED: To facilitate adjustment of the laser beam or electron beam irradiating position. ;SOLUTION: An XY stage 21 to be driven in XY direction is set with a plate 51 having a micro protrusion 51a. A laser light source 32 projecting a laser beam toward the XY stage 21 and a photodetector 33 for detecting the laser beam are arranged above the XY stage 21. The XY stage 21 is drivenon the basis of a position where the photodetector 33 detects the laser light projected from the laser light source 32 and scattered by the protrusion 51a.;COPYRIGHT: (C)1998,JPO
机译:要解决的问题:便于调整激光束或电子束的照射位置。 ;解决方案:要在XY方向上驱动的XY载物台21设置有带有微突起51a的板51。朝向XY台21投射激光束的激光源32和用于检测激光束的光电检测器33布置在XY台21的上方。基于光电检测器33检测激光的位置来驱动XY台21。从激光光源32投射并被突起51a散射。版权所有:(C)1998,JPO

著录项

  • 公开/公告号JPH1090195A

    专利类型

  • 公开/公告日1998-04-10

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP;KEMITORONIKUSU:KK;

    申请/专利号JP19960242045

  • 发明设计人 KIDO TAKASHI;ICHIKAWA NAOJIRO;KANO EIJI;

    申请日1996-09-12

  • 分类号G01N21/88;G02B21/06;H01J37/22;H01J37/252;H01L21/66;H01S3/00;

  • 国家 JP

  • 入库时间 2022-08-22 03:02:50

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