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GROWTH OF FERRODIELECTRIC FILM OF PB PEROVSKITE TYPE STRUCTURE

机译:PB钙钛矿型结构的铁电薄膜的生长

摘要

PROBLEM TO BE SOLVED: To provide a method for allowing a ferrodielectric film of Pb perovskite type structure to grow, enabling to produce the oriented film of the ferrodielectric film of Pb perovskite type structure free from compositional abnormality by a general MOCVD method. ;SOLUTION: This method for allowing a ferrodielectric film of Pb perovskite type structure to grow comprises guiding the vapors of organic metal raw materials containing at least Pb to the Pt surface of a substrate having the Pt surface in a surface direction (100) at a prescribed film-forming speed of 10-200nm/hr, preferably ≤170nm/hr, and at a substrate temperature of ≤550°C, preferably 500°C, in an oxidizing gas atmosphere, and simultaneously subjecting the thin film of Pb perovskite type structure to its chemical gas phase growth on the Pt surface. Thereby, the ferrodielectric film of Pb perovskite type structure high in the orientation degree can be allowed to grow by the use of a general MOCVD device.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:提供一种使Pb钙钛矿型结构的铁电介质膜生长的方法,该方法能够通过普通的MOCVD方法制造没有组成异常的Pb钙钛矿型结构的铁电介质膜的取向膜。 ;解决方案:这种使钙钛矿型Pb结构的铁电介质膜生长的方法包括在表面方向(100)将至少包含Pb的有机金属原料蒸气沿表面方向(100)引导至具有Pt表面的基板的Pt表面。规定的成膜速度为10-200nm / hr,优选≤170nm/ hr,并且在氧化性气氛中,在≤550°C,优选<500°C的基材温度下,同时对钙钛矿Pb薄膜进行处理型结构使其化学气相在Pt表面生长。由此,可以通过使用常规的MOCVD装置来生长取向度高的Pb钙钛矿型结构的铁电介质膜。版权所有:(C)1998,JPO

著录项

  • 公开/公告号JPH1067556A

    专利类型

  • 公开/公告日1998-03-10

    原文格式PDF

  • 申请/专利权人 JAPAN ENERGY CORP;

    申请/专利号JP19960223925

  • 发明设计人 TOKITA KOJI;

    申请日1996-08-26

  • 分类号C04B35/46;C23C16/18;C23C16/46;

  • 国家 JP

  • 入库时间 2022-08-22 03:02:03

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