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A device for detecting the presence or absence of an abnormality in the thermocouple for temperature correction in a reaction chamber for a semiconductor manufacturing process

机译:一种用于检测用于半导体制造过程的反应室中的温度校正的热电偶中是否存在异常的装置

摘要

The purpose of this study is not to use professional meters, but also to easily confirm the abnormal situation of the temperature maintenance heat brigade installed in the reaction chamber for semiconductor manufacturing in a short time, so as to make the project go smoothly.For this reason,In this study, a lifebuoy (2) with a halide lamp (1) as a heating tool is used,A quartz tube (3) inserted and installed in the tube (2),An infrared thermometer (4) and for detecting the temperature of the tube (2) listed in the halide lamp (1),Insert the quartz tube (3) into the inner part to detect the temperature of the inner part of the quartz tube (3), and,According to the above infrared thermometer (4) and temperature assurance thermocouple (5) are respectively connected. When the halogen lamp (1) is heated, the temperature value detected by the infrared thermometer (4) and temperature assurance thermocouple (5) is compared to determine whether the temperature of temperature assurance thermocouple (5) is abnormal. The semiconductor manufacturing device (6) is composed of temperature controller (6) Abnormal detection device of Thermoelectric Group with temperature maintaining capacity in reaction chamber for engineering.
机译:这项研究的目的不是使用专业仪表,而是为了在短时间内轻松确认安装在用于半导体制造的反应室中的温度维持热旅的异常情况,从而使项目顺利进行。因此,在本研究中,我们使用了带有卤素灯(1)作为加热工具的救生圈(2),插入并安装在石英管(2)中的石英管(3),红外温度计(4)并用于检测将卤化物灯(1)中列出的灯管(2)的温度插入石英灯管(3)的内部以检测石英灯管(3)的内部温度,然后根据上述说明分别连接了红外温度计(4)和温度保证热电偶(5)。加热卤素灯(1)时,比较红外温度计(4)和温度保证热电偶(5)检测到的温度值,以确定温度保证热电偶(5)的温度是否异常。半导体制造装置(6)由温度控制器(6)构成,在工程用反应室内具有保持温度的能力的热电族的异常检测装置。

著录项

  • 公开/公告号KR970064196U

    专利类型

  • 公开/公告日1997-12-11

    原文格式PDF

  • 申请/专利权人 엘지반도체주식회사;

    申请/专利号KR19960013859U

  • 发明设计人 방현일;

    申请日1996-05-30

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-22 02:45:55

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