首页> 外国专利> A method for producing a pair of anti-fuses in a prom - chip and programmable read only - - memory chip (prom) with pairs of mosfet - devices

A method for producing a pair of anti-fuses in a prom - chip and programmable read only - - memory chip (prom) with pairs of mosfet - devices

机译:一种用于在带有一对mosfet设备的可编程芯片和可编程只读存储器芯片(prom)中产生一对反熔丝的方法

摘要

a programmable lesespeichervorrichtung only with a antisicherung in the drain node of a feldeffektransistors and a manufacturing process are revealed. the programming is performed by connecting a high voltage to the drain and gate of the transistor which makes the antisicherung into a closed circuit, the transistor open circuit appears otherwise.attaching the antisicherung in drain node instead of the source node avoids problems with reverse source tensioning.
机译:揭示了仅在场效应晶体管的漏极节点中具有反硅化作用的可编程lesespeichervorrichtung及其制造工艺。通过将高电压连接到晶体管的漏极和栅极来执行编程,这将使防抱死成为闭合电路,否则会出现晶体管开路。将防抱死附接到漏极节点而不是源极节点可避免源极反向张紧的问题。

著录项

  • 公开/公告号DE4326489C2

    专利类型

  • 公开/公告日1998-09-24

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC. BOISE ID. US;

    申请/专利号DE19934326489

  • 发明设计人 LEE ROGER RUOJIA BOISE ID. US;

    申请日1993-08-06

  • 分类号H01L27/112;H01L29/78;H01L21/8246;

  • 国家 DE

  • 入库时间 2022-08-22 02:43:19

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号