首页> 美国政府科技报告 >Reliability Evaluation of Programmable Read-Only Memories (PROMs). Part III:Ultraviolet Erasable PROMs.
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Reliability Evaluation of Programmable Read-Only Memories (PROMs). Part III:Ultraviolet Erasable PROMs.

机译:可编程只读存储器(pROm)的可靠性评估。第三部分:紫外线可擦除pROm。

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摘要

Ultraviolet erasable programmable read-only memories (UV-PROMs), type 2708 and 8192-bits capacity, were evaluated. Military grade parts were obtained from two manufacturers. All parts were put through screening tests for package hermeticity, erasability, programmability, and electrical performance. A Tektronix S-3260 automatic test system was used for electrical measurements. 'Shmoo' plots showed that these UV-PROMs can operate with power supply tolerance of + or - 10 percent at -55 to +125 C. Retention of data during storage was found to be adequate.

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