首页> 外国专利> OR-plane memory cell array for flash memory with bit-based write capability, and methods for programming and erasing the memory cell array

OR-plane memory cell array for flash memory with bit-based write capability, and methods for programming and erasing the memory cell array

机译:具有基于位的写能力的用于闪存的或平面存储器单元阵列,以及用于编程和擦除存储器单元阵列的方法

摘要

A memory cell array of a flash electrically erasable programmable read only memory (EEPROM) includes a plurality of transistor cells arranged in rows and columns. The sources of transistor cells in the same memory block are connected to a main source line through a control gate, as are the drains. The separate source and drains in the column direction are designed for a bit-based write capability. Writing, such as erasing or programming, of a selected transistor cell uses the Fowler- Nordheim tunneling method and can be accomplished due to the programming or erase inhibit voltage that is applied to non-selected transistor cells. The associated circuitry for bit-based writing, as well as methods of programming and erasing the memory cell array, with over- program and over-erase repair capability, are also disclosed.
机译:闪存电可擦可编程只读存储器(EEPROM)的存储单元阵列包括以行和列布置的多个晶体管单元。同一存储块中的晶体管单元的源极通过漏极与控制极连接到主源极线。沿列方向分开的源极和漏极专为基于位的写功能而设计。所选晶体管单元的写入(例如擦除或编程)使用Fowler-Nordheim隧穿方法,并且由于施加到未选择的晶体管单元的编程或擦除禁止电压而可以完成。还公开了用于基于位的写入的相关电路以及具有过度编程和过度擦除修复能力的编程和擦除存储单元阵列的方法。

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