Semiconductor device capable of externally and readily identifying set bonding optional function and method of identifying internal function of semiconductor device

摘要

A checking circuit is provided which electrically and selectively connects a pad to which an internal circuit is connected, to a reference potential source node, in accordance with a potential of a special pad, when activated. The checking circuit is activated when a burn-in mode detection signal is activated. By detecting a leak current of a pin terminal to which the pad connected to the circuit is electrically connected, the potential of the special pad, that is, set internal function, can be externally identified. Accordingly, a bonding option function of which internal function is set in accordance with the potential of the bonding pad, can be externally detected in a non- destructive manner.