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GaAs substrate with compositionally graded AlGaAsSb buffer for fabrication of high-indium fets

机译:具有成分梯度AlGaAsSb缓冲液的GaAs衬底,用于制造高铟FET

摘要

Semiconductor devices made in highindium-content semiconductor material have advantageous properties, but similar substrate materials are hard to handle. A buffer layer makes a lattice-constant transition between a GaAs substrate and a high-indium epitaxially deposited semiconductor such as those lattice-matched to InP. The buffer layer is an epitaxial layer including atoms of two Group III elements, and atoms of two Group V elements, with the ratio of the atoms of at least one group varied along the depth of the buffer layer, in a manner which makes a transition of the lattice constant between that of the substrate and the high-Indium semiconductor material. The Group III elements are gallium and aluminum, and the Group V elements are arsenic and antimony.
机译:用高铟含量的半导体材料制成的半导体器件具有有利的性能,但是类似的衬底材料难以处理。缓冲层在GaAs衬底和高铟外延沉积的半导体(例如与InP晶格匹配的那些)之间形成晶格常数过渡。缓冲层是包括两个III族元素的原子和两个V族元素的原子的外延层,其中至少一个族的原子的比率沿着缓冲层的深度变化,从而进行过渡。衬底和高铟半导体材料的晶格常数之间的关系。第三族元素是镓和铝,第五族元素是砷和锑。

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