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GaAs SUBSTRATE WITH COMPOSITIONALLY GRADED AlGaAsSb BUFFER FOR FABRICATION OF HIGH-INDIUM FETS

机译:GaAs复合梯度AlGaAssb缓冲材料制备高中

摘要

Semiconductor devices made in high-indium-content semiconductor material (16) have advantageous properties, but similar substrate materials are hard to handle. A buffer layer (18) makes a lattice-constant transition between a GaAs substrate and a high-indium epitaxially deposited semiconductor such as those lattice-matched to InP. The buffer layer (18) is an epitaxial layer including atoms of two Group III elements, and atoms of two Group V elements, with the ratio of the atoms of at least one group varied along the depth of the buffer layer, in a manner which makes a transition of the lattice constant between that of the substrate and the high-indium semiconductor material. The Group III elements are gallium and aluminum, and the Group V elements are arsenic and antimony.
机译:用高铟含量的半导体材料(16)制成的半导体器件具有有利的性能,但是类似的衬底材料难以处理。缓冲层(18)在GaAs衬底和高铟外延沉积的半导体(例如与InP晶格匹配的那些)之间进行晶格恒定的转变。缓冲层(18)是包括两个III族元素的原子和两个V族元素的原子的外延层,其中至少一个族的原子的比率沿着缓冲层的深度变化,其方式为晶格常数在衬底和高铟半导体材料的晶格常数之间跃迁。 III族元素是镓和铝,V族元素是砷和锑。

著录项

  • 公开/公告号EP0840942B1

    专利类型

  • 公开/公告日2004-02-25

    原文格式PDF

  • 申请/专利权人 BAE SYSTEMS INFORMATION;

    申请/专利号EP19960941332

  • 发明设计人 UPPAL PARVEZ NASIR;GILL DAVID M.;

    申请日1996-11-08

  • 分类号H01L21/203;H01L29/205;H01L31/0304;

  • 国家 EP

  • 入库时间 2022-08-21 22:58:16

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