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On-chip primary cache testing circuit and test method

机译:片上一级缓存测试电路及测试方法

摘要

A primary cache test system is supplied using a secondary cache that closely matches specifications of the primary cache. Coherency is maintained between the primary and secondary caches using inclusion by a write-once protocol. The test system includes software which suspends cache operations on receipt of an error signal from a secondary cache controller or by periodically pausing cache operations for cache operation monitoring. During suspension of cache operations, the software verifies the states of the primary cache against the states and data within the secondary cache. Signals on cache hit and hit-modified pins that are available on the microprocessor integrated circuit are monitored to detect various error conditions. Error analysis includes detection of invalid hits to the primary cache, incorrectly modified lines in the primary cache and misses to the primary cache that should be hits.
机译:使用与主高速缓存的规格非常匹配的辅助高速缓存来提供主高速缓存测试系统。通过一次写入协议的包含,可以在主缓存和辅助缓存之间保持一致性。该测试系统包括软件,该软件在接收到来自辅助高速缓存控制器的错误信号时或通过周期性地暂停高速缓存操作以监视高速缓存操作来中止高速缓存操作。在暂挂高速缓存操作期间,软件将对照辅助高速缓存中的状态和数据验证主高速缓存的状态。监视微处理器集成电路上可用的高速缓存命中和命中修改的引脚上的信号,以检测各种错误情况。错误分析包括检测对主缓存的无效命中,对主缓存中的错误修改行以及对应命中的主缓存的未命中。

著录项

  • 公开/公告号US5793941A

    专利类型

  • 公开/公告日1998-08-11

    原文格式PDF

  • 申请/专利权人 ADVANCED MICRO DEVICES INC.;

    申请/专利号US19950566876

  • 发明设计人 JENNIFER B. PENCIS;ATISH GHOSH;

    申请日1995-12-04

  • 分类号G06F11/34;

  • 国家 US

  • 入库时间 2022-08-22 02:38:53

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