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Ferroelectric random access memory circuits and structures for preventing ferroelectric capacitors from memory failure

机译:铁电随机存取存储器电路和用于防止铁电电容器发生存储器故障的结构

摘要

A novel ferroelectric random access memory structure which comprises a capacitor consisting of upper and lower plane electrodes and a ferroelectric inserted therebetween, and a transistor comprising a means of inducing the capacitor to polarization and maintaining it, connected with at least one of the electrodes, wherein the electric potential of the upper electrode is equalized with that of the lower electrode, thereby preventing the polarization reversal caused by pyroelectric charges.
机译:一种新颖的铁电随机存取存储器结构,其包括由上下平面电极和插入其间的铁电体组成的电容器,以及与至少一个电极相连的晶体管,该晶体管包括使电容器极化并保持其极化的装置,其中,上部电极的电位与下部电极的电位相等,从而防止了由热电荷引起的极化反转。

著录项

  • 公开/公告号US5822240A

    专利类型

  • 公开/公告日1998-10-13

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US19950549898

  • 发明设计人 IN-KYUNG YOO;

    申请日1995-10-30

  • 分类号G11C11/22;

  • 国家 US

  • 入库时间 2022-08-22 02:38:23

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