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Net-shape ceramic processing for electronic devices and packages

机译:电子设备和包装的网状陶瓷加工

摘要

An electronic device package is provided, consisting of reaction bonded silicon nitride structural and dielectric components and conductor, resistor, and capacitor elements positioned with the package structural components. The package consists of a ceramic package base characterized by a dielectric constant less than 6, of reaction bonded silicon nitride, or a heat spreader material. An electrical conductor is positioned on, embedded in, or attached to the package base for making electrical contact to an electronic device supported on the base and in preferred embodiments, a resistor is attached to the package base. The invention also provides package sidewalls connected to the package base, preferably of reaction bonded silicon nitride, and at least one electrical conductor extending to an outside surface of the package sidewalls for making electrical contact to an electronic device supported by the package base. The reaction formed electronic device packages of the invention provide the ability to support high device signal frequencies, high device operational temperatures, and high environmental temperatures, due to the characteristics of the package materials. The reaction formed electronic device packages of the invention may be produced with a nitriding process during which the overall package structure exhibits minimal shrinkage. As a result, the reaction formed electronic device packages of the invention may be shaped to finished dimensions before the nitriding process with complicated and tight- tolerance geometries of package structural, conducting, resistive, and capacitive components.
机译:提供了一种电子装置封装,其由反应结合的氮化硅结构和介电部件以及与封装结构部件一起放置的导体,电阻器和电容器元件组成。封装由特征为介电常数小于6的陶瓷封装基座,反应结合的氮化硅或散热器材料组成。电导体定位在封装基座上,嵌入其中或附接到封装基座,以与支撑在基座上的电子设备进行电接触,并且在优选实施例中,电阻器附接到封装基座。本发明还提供了连接至封装件基座的封装件侧壁,该侧壁优选地由反应结合的氮化硅制成,并且至少一个电导体延伸至封装件侧壁的外表面,以与由封装件基座支撑的电子器件进行电接触。由于包装材料的特性,本发明的反应形成的电子装置封装提供了支持高装置信号频率,高装置工作温度和高环境温度的能力。本发明的反应形成的电子器件封装可以通过氮化工艺来生产,在该氮化工艺中整个封装结构表现出最小的收缩。结果,在氮化工艺之前,本发明的反应形成的电子器件封装可以被成形为最终尺寸,具有封装结构,导电,电阻和电容组件的复杂且紧密公差的几何形状。

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