首页> 外国专利> METHOD FOR DETERMINING ANALYTICAL EQUATION OF FRINGE SCAN INTERFERENCE MEASUREMENT AND FRINGE SCAN INTERFEROMETER

METHOD FOR DETERMINING ANALYTICAL EQUATION OF FRINGE SCAN INTERFERENCE MEASUREMENT AND FRINGE SCAN INTERFEROMETER

机译:条纹扫描干涉测量和条纹扫描干涉仪的解析方程确定方法

摘要

PROBLEM TO BE SOLVED: To make the subject method applicable at the time of the analysis of fringe scan interference measurement exceeding a predetermined number of buckets as well by determining constants in a predetermined equation so as to minimize the error of a phase to be inspected caused by the error of the shift amount of a phase difference at the time of obtaining a phase to be inspected given by a surface to be inspected or an object to be inspected through the use of the predetermined equation. ;SOLUTION: The same beam is split into measuring light and reference light. The measuring light is reflected at a surface to be inspected, and then both beams are integrated to form interference fringes. The intensity data (g) of the interference fringes at each point at the surface to be inspected is measured, and measurement is which the phase difference between the measuring light and the reference light is shifted by π/2.j (j=0, ±1, ±2,..., ±n; n is a natural number) with respect to a reference state is performed 2n+1 times to measure the intensity data (g) of the interference fringes. Then at the time of obtaining a phase to be inspected θ given to the surface to be inspected by an equation, if we let the shift amount of the phase difference π/2.j have an error proportional to (j), constants Aj and Bj are determined so as to minimize the error of the phase to be inspected θ caused by the error of the shift amount. By this, application to the analysis of fringe scan interference measurement above 7 buckets is possible.;COPYRIGHT: (C)1999,JPO
机译:解决的问题:通过确定预定方程式中的常数,以使本发明的方法在分析条纹扫描干扰测量结果超过预定数量的桶时适用,以使所检查的相的误差最小化通过使用预定的方程,获得由被检查表面或被检查物体给出的被检查相位时的相位差的偏移量的误差。 ;解决方案:同一光束分为测量光和参考光。测量光在要检查的表面上反射,然后将两个光束合并以形成干涉条纹。测量待检查表面上每个点处的干涉条纹的强度数据(g),然后进行测量,使测量光与参考光之间的相位差偏移π/ 2.j(j = 0,相对于参考状态,进行±1,±2,...,±n; n为自然数)2n + 1次,以测量干涉条纹的强度数据(g)。然后,在通过等式求出被检相的θ时,如果使相位差π/ 2.j的偏移量具有与(j)成比例的误差,则常数Aj和Aj为0。 Bj被确定为使得由偏移量的误差引起的被检查相位θ的误差最小。通过这种方法,有可能将其应用于7个以上桶的条纹扫描干涉测量的分析中。;版权所有:(C)1999,日本特许厅

著录项

  • 公开/公告号JPH11173808A

    专利类型

  • 公开/公告日1999-07-02

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP19970361897

  • 发明设计人 SHIYU IKUSOU;

    申请日1997-12-09

  • 分类号G01B9/02;

  • 国家 JP

  • 入库时间 2022-08-22 02:35:44

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