首页> 外国专利> DEPOSITION OF SILICON DIOXIDE BY PLASMA-ACTIVATED VAPORIZATION PROCESS

DEPOSITION OF SILICON DIOXIDE BY PLASMA-ACTIVATED VAPORIZATION PROCESS

机译:等离子体活化的汽化过程沉积二氧化硅

摘要

PROBLEM TO BE SOLVED: To impart resistance to UV deterioriation and wear resistance (scratch resistance) by forming the oxide film modified with a flexible organosilicon by a combination of physical and chemical vapor deposition on a polycarbonate sheet coated with hard silicon. ;SOLUTION: A polycarbonate sheet 1 is traveled on the upper face of the movable pallet 2 on top of a vacuum chamber, and the silica vaporized by plasma-activated reaction is deposited through the window of the pallet 2. In this case, an electron-beam gun 5 is moved in the axial direction of a rotary drum 4 arranged below the pallet 2, the drum 4 surface is bombarded to vaporize the silica, and the vapor current is passed through the high-density plasma from a multiple hollow cathode plasma source 6. In this case, a uniform plasma density is imparted in the width direction of the sheet 1 by the plasma source 6, and the nitrogen monoxide, organosilicon and/or an oxygen reacting gas supplied from the reactive gas manifolds 7 and 8 are combined with the silica passing through the plasma.;COPYRIGHT: (C)1999,JPO
机译:解决的问题:通过物理和化学气相沉积结合在涂有硬硅的聚碳酸酯板上形成用柔性有机硅改性的氧化膜,从而赋予抗紫外线劣化和耐磨性(耐刮擦性)的能力。 ;解决方案:聚碳酸酯薄板1在真空室顶部的可移动托盘2的上表面移动,并且通过等离子体激活反应蒸发的二氧化硅通过托盘2的窗口沉积。射束枪5沿布置在托盘2下方的旋转鼓4的轴向移动,轰击鼓4的表面以蒸发二氧化硅,并且蒸汽流从多个空心阴极等离子体流过高密度等离子体在这种情况下,通过等离子体源6在片材1的宽度方向上赋予均匀的等离子体密度,并且从反应气体歧管7和8供应的一氧化氮,有机硅和/或氧气反应气体为与通过等离子体的二氧化硅结合。;版权所有:(C)1999,日本特许厅

著录项

  • 公开/公告号JPH1171676A

    专利类型

  • 公开/公告日1999-03-16

    原文格式PDF

  • 申请/专利权人 GENERAL ELECTRIC CO GE;

    申请/专利号JP19980177932

  • 发明设计人 IACOVANGELO CHARLES DOMINIC;

    申请日1998-06-25

  • 分类号C23C16/42;C23C14/06;C23C14/32;C23C16/50;H01L21/31;

  • 国家 JP

  • 入库时间 2022-08-22 02:35:26

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