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X-RAY LITHOGRAPHY DEVICE AND X-RAY ALIGNING METHOD

机译:X射线光刻设备和X射线成象方法

摘要

PROBLEM TO BE SOLVED: To enable an image to be corrected for distortions and magnification by a method, wherein an X-ray reflecting drive system is connected to an X-ray reflecting mirror which is so constituted as to very reflection conditions according to an in-plane position, and an X-ray reflecting mirror control system is connected to the X-ray reflecting mirror drive system. ;SOLUTION: An X-ray reflecting mirror 805 is connected to an X-ray reflecting mirror drive system 811, which is controlled by an X-ray reflecting mirror control system 810 which controls the orientation and swing of the X-ray reflecting mirror 805 and the position of X-rays incident on the reflecting mirror 805. An X-ray detector 807 measures the parallelism of X-rays reflected from the X-ray reflecting mirror 805 in a horizontal and a vertical direction as two-dimensional data, the X-ray detection signals are inputted into the X-ray reflecting mirror control system 810 to drive the X-ray reflecting mirror 805, and the pattern of an X-ray mask 812 is transferred to an exposure substrate 814. Moreover, the X-ray reflecting mirror 805 is varied in light-reflecting characteristics according to its in-plane 1 position.;COPYRIGHT: (C)1999,JPO
机译:解决的问题:通过一种方法校正图像的畸变和放大率,其中将X射线反射驱动系统连接到X射线反射镜,该X射线反射镜根据入射光的反射条件而构成。平面位置,并且X射线反射镜控制系统连接到X射线反射镜驱动系统。解决方案:X射线反射镜805连接到X射线反射镜驱动系统811,该系统由X射线反射镜控制系统810控制,该系统控制X射线反射镜805的方向和摆动X射线检测器807将在水平方向和垂直方向上从X射线反射镜805反射的X射线的平行度测量为二维数据,并将X射线入射在反射镜805上的位置。 X射线检测信号被输入到X射线反射镜控制系统810以驱动X射线反射镜805,并且X射线掩模812的图案被转印到曝光基板814。光线反射镜805的光反射特性根据其面内1位置而变化。;版权所有:(C)1999,JPO

著录项

  • 公开/公告号JPH1174181A

    专利类型

  • 公开/公告日1999-03-16

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP19970234780

  • 发明设计人 MITSUI SOICHIRO;MUROOKA KENICHI;

    申请日1997-08-29

  • 分类号H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-22 02:34:55

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