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STRESS TEST METHOD FOR INTEGRATED CIRCUIT WITH MEMORY AND INTEGRATED CIRCUIT WITH STRESS TESTER FOR MEMORY
STRESS TEST METHOD FOR INTEGRATED CIRCUIT WITH MEMORY AND INTEGRATED CIRCUIT WITH STRESS TESTER FOR MEMORY
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机译:记忆集成电路的应力测试方法及记忆测试仪集成电路的应力测试方法
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摘要
PROBLEM TO BE SOLVED: To shorten the time required for testing a memory by forming a stress select means on a substrate and performing a stress test only at a selected part on a memory block in order to decide whether the memory block is accepted or not. ;SOLUTION: An integrated circuit 10 having enhanced test capacity comprises a substrate 11, and a memory block 20 including a plurality of memory cells 25 arranged in a matrix having a plurality of rows R and columns C. A selectable stress tester 30 including a selectable test pattern generating means is formed on the substrate 11. The test pattern generating means generates a test pattern selectively over the boundary only between two adjacent rows R and two adjacent columns C of the memory block 20. A decision is made whether a selected part of the memory block 20 is acceptable or not by applying a high frequency waveform signal of about 100 MHz.;COPYRIGHT: (C)1999,JPO
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