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Platinum thin film forming method, substrate manufactured by the method, electronic device using the substrate, and method of manufacturing the electronic device

机译:铂薄膜形成方法,通过该方法制造的基板,使用该基板的电子设备以及该电子设备的制造方法

摘要

PROBLEM TO BE SOLVED: To make it possible to form a platinum film, having mostly prioritized orientation of (200) direction, on an insulation layer oxide. SOLUTION: An insulation oxide film layer 12 is formed on a surface of silicon wafer 11 (step S2). A platinum layer containing oxygen is formed on the insulation oxide thin film layer by heating the wafer 11 from the room temperature to 700 deg.C and depositing platinum on the insulation oxide thin film (step S3). The platinum layer is converted to a pure platinum thin layer 15 removing oxygen from the platinum layer by heating the wafer 11 at 400 deg.C-1000 deg.C. The prioritized orientation of (200) direction, expressed by equation, on the pure platinum thin layer 15 is more than 90%.
机译:解决的问题:为了能够在绝缘层氧化物上形成铂膜,该铂膜具有优先的(200)方向取向。解决方案:在硅晶片11的表面上形成绝缘氧化膜层12(步骤S2)。通过将晶片11从室温加热到700℃并在绝缘氧化物薄膜上沉积铂,在绝缘氧化物薄膜层上形成含氧的铂层(步骤S3)。通过在400℃至1000℃下加热晶片11,将铂层转化为纯铂薄层15,以从铂层去除氧。用等式表示的在纯铂薄层15上的(200)方向的优先取向大于90%。

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