首页> 外国专利> USE OF PALLADIUM IMMERSION DEPOSITION TO SELECTIVELY INITIATE ELECTROLESS PLATING ON TI AND W ALLOYS FOR WAFER FABRICATION

USE OF PALLADIUM IMMERSION DEPOSITION TO SELECTIVELY INITIATE ELECTROLESS PLATING ON TI AND W ALLOYS FOR WAFER FABRICATION

机译:使用钯浸渍沉积法来选择性地初始化TI和W合金上的无电解电镀以进行晶圆制造

摘要

(57) AbstractA method for making integrated circuit wafers wherein the wafer has vias or other openings in the wafer which openings have abarrier/adhesion or other metal layer which is metallized to form the circuit comprising activating the metal layer and then sensitizing themetallic layer using a sensitizing displacement composition comprising preferably an alkaline palladium non-ammonia nitrogen (ethylenediamine) complex which is contacted with the wafer at a specially controlled pH. The wafer is activated using an activation solution whichcontains a complexing agent for any dissolved metal. The sensitizing solution also preferably contains a complexing agent for dissolvedmetal and preferably contains a second complexing agent such as EDTA to solubilize base metal contaminants.
机译:(57)摘要一种制造集成电路晶片的方法,其中晶片具有通孔或晶片中的其他开口,其中开口具有金属化以形成电路的阻挡层/粘附层或其他金属层,包括激活金属层,然后敏化金属层使用敏化置换组合物的金属层,所述敏化置换组合物优选包含碱性钯非氨氮(乙烯二胺)络合物,在特殊控制的pH下与晶片接触。使用激活溶液激活晶片包含任何溶解金属的络合剂。敏化溶液还优选包含用于溶解的络合剂。金属,优选包含第二种络合剂,例如EDTA,以溶解贱金属污染物。

著录项

  • 公开/公告号SG53612A1

    专利类型

  • 公开/公告日1998-11-16

    原文格式PDF

  • 申请/专利权人 ENTHONE-OMI INC.;

    申请/专利号SG1998027410

  • 发明设计人 OBERLE ROBERT R.;

    申请日1996-12-11

  • 分类号B05D5/12;B05D3/04;B05D1/18;

  • 国家 SG

  • 入库时间 2022-08-22 02:25:55

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