Method for quantitative microanalysis of metal alloys of x based on a set of samples of the alloy and a mathematical model adjustment rays.

摘要

METHOD FOR QUANTITATIVE microanalysis X RAYS OF METAL ALLOYS BASED ON A SET OF SAMPLES PATRON ALLOY AND A MATHEMATICAL MODEL ADJUSTMENT. The method is based on applying a device that contains a set of ALLOYS THE SAME BASE METAL homogeneous chemically and structurally, suitable for use as standards in quantitative microanalysis ALLOY METAL STAKE IN SYSTEMS ANALYSIS OF LIGHTNING X DETECTOR EMPLOYING energy dispersive (EDS), or a dispersion wavelength (WDS), attached to a Scanning Electron Microscope (SEM) OR ELECTRONIC microprobe (EPMA). USING SUCH DEVICE IS CALIBRA analysis system, the test sample is prepared, GET THE NET CURRENTS OF EACH ELEMENT AND INTRODUCING THE VALUES OF THE CURRENT NET IN A fitting equation relating Mathematically intensities ELEMENTS WITH THE COMPOSITION centesimal to calculate the composition of the test sample. This method has application in the steel industry.