首页> 外国专利> PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION (PECVD) METHOD OF FORMING VANADIUM OXIDE FILMS AND VANADIUM OXIDE THIN-FILMS PREPARED THEREBY

PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION (PECVD) METHOD OF FORMING VANADIUM OXIDE FILMS AND VANADIUM OXIDE THIN-FILMS PREPARED THEREBY

机译:等离子体增强化学气相沉积(PECVD)形成氧化钒薄膜的方法及其制备的氧化钒薄膜

摘要

A method is disclosed of forming a vanadium oxide film (22) on a substrate (20) utilizing plasma enhanced chemical vapor deposition. The method includes positioning a substrate (20) within a plasma reaction chamber (12) and then forming a precursor gas comprised of a vanadium-containing chloride gas in an inert carrier gas. This precursor gas is then mixed with selected amounts of hydrogen and oxygen and directed into the reaction chamber (12). The amounts of precursor gas, oxygen and hydrogen are selected to optimize the final properties of the vanadium oxide film (22). An rf plasma (14) is generated within the reaction chamber (12) to chemically react the precursor gas with the hydrogen and the oxygen to cause deposition of a vanadium oxide film (22) on the substrate (20) while the chamber deposition pressure is maintained at about one torr or less. Finally, the byproduct gases are removed from the plasma reaction chamber (12).
机译:公开了一种利用等离子体增强化学气相沉积在衬底(20)上形成氧化钒膜(22)的方法。该方法包括将衬底(20)放置在等离子体反应室(12)内,然后在惰性载气中形成由含钒的氯化物气体组成的前体气体。然后将该前体气体与选定量的氢和氧混合并导入反应室(12)。选择前体气体,氧气和氢气的量以优化氧化钒膜(22)的最终性能。在反应室(12)中产生射频等离子体(14),以使前驱物气体与氢气和氧气发生化学反应,从而在室沉积压力为20℃时在基板(20)上沉积钒氧化物膜(22)。保持在约一托或更少。最后,将副产物气体从等离子体反应室(12)中除去。

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