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Heterojunction dipole device structure using heterogeneous base doping source

机译:使用异质基极掺杂源的异质结偶极器件结构

摘要

The present invention relates to a heterojunction dipole device structure using a double base doping source.;Heterojunction dipole devices are compound semiconductors of gallium arsenide (GaAs) or indium phosphorus (InP) systems, and are widely used in integrated circuits for ultrafast optical information communication or wireless communication that process data of ultrafast electronic devices.;Problems caused by anomalous diffusion and hydrogen passivation related to p-type impurities in the prior art are localized by doping impurities of the base of a heterojunction dipole device (HPT) and doping impurities of different properties for each region. To solve this problem, HBT's ultra-fast operating characteristics and reliability were improved.
机译:本发明涉及一种使用双基掺杂源的异质结偶极器件结构。异质结偶极器件是砷化镓(GaAs)或铟磷(InP)系统的化合物半导体,并且广泛用于集成电路中以进行超快的光信息通信。现有技术中与p型杂质有关的异常扩散和氢钝化引起的问题可以通过掺杂异质偶极器件(HPT)的基极的杂质和掺杂杂质来实现。每个区域的不同属性。为了解决这个问题,HBT的超快运行特性和可靠性得到了改善。

著录项

  • 公开/公告号KR19990069132A

    专利类型

  • 公开/公告日1999-09-06

    原文格式PDF

  • 申请/专利权人 김효근;

    申请/专利号KR19980003180

  • 发明设计人 송종인;

    申请日1998-02-05

  • 分类号H01L29/737;

  • 国家 KR

  • 入库时间 2022-08-22 02:16:45

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