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MODULE IC HOLDING APPARATUS FOR MODULE IC TESTER

机译:用于模块式IC测试器的模块式IC保持装置

摘要

The present invention relates to a module IC holding device of the module IC tester, and more specifically, to load the module IC in a state where the contact pins of the socket are opened, and then contact the contact pins to the pattern.;To this end, a plurality of sliders 6 horizontally coupled to the upper surface of the base 5 and a plurality of contact pins 8 in point contact with the module IC 1 are fixed to each slider. A printed circuit board (9) and a guider (16) which guides both sides so that the module IC installed and loaded on the base so as to be positioned above the slider guides both sides so as to be in the correct position of the printed circuit board and is not moved during inspection. And a second cylinder 19 connected to the guider and the connecting piece 17 to move the guider forward and backward, and cam means for pinching or opening the slider to which the printed circuit board is fixed.
机译:本发明涉及一种模块IC测试器的模块IC保持装置,更具体地,涉及在插座的接触销被打开的状态下加载模块IC,然后使接触销与图案接触。为此,在水平方向上与基座5的上表面结合的多个滑块6和与模块IC 1点接触的多个接触销8固定在每个滑块上。印刷电路板(9)和引导器(16)引导两侧,从而将安装和装载在基座上的模块IC定位在滑块上方,从而引导两侧以使其处于印刷的正确位置电路板,并且在检查过程中未移动。第二缸19与导向器和连接件17相连,以使导向器向前和向后移动,以及凸轮装置,用于夹紧或打开固定有印刷电路板的滑块。

著录项

  • 公开/公告号KR0177341B1

    专利类型

  • 公开/公告日1999-04-15

    原文格式PDF

  • 申请/专利权人 MIRAE CORPORATION;

    申请/专利号KR19960011590

  • 发明设计人 김두철;

    申请日1996-04-17

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-22 02:16:14

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