首页> 外国专利> Potential detecting circuit for determining whether a detected potential has reached a prescribed level, and a semiconductor integrated circuit including the same

Potential detecting circuit for determining whether a detected potential has reached a prescribed level, and a semiconductor integrated circuit including the same

机译:用于确定检测到的电位是否已达到规定水平的电位检测电路以及包括该电位检测电路的半导体集成电路

摘要

A potential detecting circuit includes an output node, a reference current supplying circuit for supplying a prescribed reference current to the output node, a detection node to which the potential to be detected is applied, and a comparing current supplying circuit, responsive to the potential applied to the detection node, for supplying a comparing current to the output node. The comparing current supplying circuit includes a detection resistance element through which a detection current flows in response to the potential applied to the detection node, and a current mirror circuit responsive to the detection current for controlling supplying the comparing current. When the potential applied to the detection node attains the prescribed detection level, an additional current supplying circuit supplies an addition current to the output node in addition to the comparing current.
机译:电位检测电路包括输出节点,用于将规定的基准电流提供给输出节点的基准电流提供电路,响应于所施加的电位而向其施加了要检测的电位的检测节点,以及比较电流提供电路。到检测节点,用于向输出节点提供比较电流。比较电流提供电路包括:检测电阻元件,响应于施加到检测节点的电位,检测电流流过该检测电阻元件;以及响应于该检测电流的电流镜电路,用于控制提供比较电流。当施加到检测节点的电势达到规定的检测电平时,除了比较电流之外,附加电流提供电路还向输出节点提供附加电流。

著录项

  • 公开/公告号US5847597A

    专利类型

  • 公开/公告日1998-12-08

    原文格式PDF

  • 申请/专利权人 MITSUBISHI DENKI KABUSHIKI KAISHA;

    申请/专利号US19960755933

  • 发明设计人 TSUKASA OOISHI;YUICHIRO KOMIYA;

    申请日1996-11-25

  • 分类号G05F3/26;G05F1/575;

  • 国家 US

  • 入库时间 2022-08-22 02:09:19

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