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Method to thermally form hemispherical grain (HSG) silicon to enhance capacitance for application in high density DRAMS
Method to thermally form hemispherical grain (HSG) silicon to enhance capacitance for application in high density DRAMS
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机译:热形成半球形晶粒(HSG)硅以增强电容的方法,以用于高密度DRAM中
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摘要
An embodiment of the present discloses a thermal process for forming hemispherical grained silicon on a silicon material by the steps of: heating the silicon material to a steady state temperature; exposing the silicon material to a hydrogen containing ambient; and causing a decreasing temperature differential of the silicon material while exposing the silicon material to a silicon hydride gas. This embodiment is accomplished by using a thermal cycle having a temperature ramp up period, a temperature steady state period during at least a portion of which the H.sub.2 ambient is present and temperature ramp down period during at least a portion of which the diluted silicon hydride gas is present. A second embodiment discloses a process for forming a hemispherical grained silicon surface on at least one capacitor plate made of silicon material, by increasing the temperature of the capacitor plate in an H.sub.2 containing ambient; exposing a surface of the capacitor plate's silicon material to a cleaning gas (such as GeH.sub.4, NF.sub.3, using ultraviolet light in the presence of ozone gas, vapor hydrofluoric acid silicon hydride gas, and H.sub.2); and decreasing the temperature of the capacitor plate while exposing the capacitor plate to a silicon hydride gas.
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