首页> 外国专利> Method to thermally form hemispherical grain (HSG) silicon to enhance capacitance for application in high density DRAMS

Method to thermally form hemispherical grain (HSG) silicon to enhance capacitance for application in high density DRAMS

机译:热形成半球形晶粒(HSG)硅以增强电容的方法,以用于高密度DRAM中

摘要

An embodiment of the present discloses a thermal process for forming hemispherical grained silicon on a silicon material by the steps of: heating the silicon material to a steady state temperature; exposing the silicon material to a hydrogen containing ambient; and causing a decreasing temperature differential of the silicon material while exposing the silicon material to a silicon hydride gas. This embodiment is accomplished by using a thermal cycle having a temperature ramp up period, a temperature steady state period during at least a portion of which the H.sub.2 ambient is present and temperature ramp down period during at least a portion of which the diluted silicon hydride gas is present. A second embodiment discloses a process for forming a hemispherical grained silicon surface on at least one capacitor plate made of silicon material, by increasing the temperature of the capacitor plate in an H.sub.2 containing ambient; exposing a surface of the capacitor plate's silicon material to a cleaning gas (such as GeH.sub.4, NF.sub.3, using ultraviolet light in the presence of ozone gas, vapor hydrofluoric acid silicon hydride gas, and H.sub.2); and decreasing the temperature of the capacitor plate while exposing the capacitor plate to a silicon hydride gas.
机译:本发明的一个实施例公开了一种通过以下步骤在硅材料上形成半球形晶粒硅的热处理:将硅材料加热至稳态温度;以及将硅材料加热至稳态温度。将硅材料暴露于含氢的环境中;在使硅材料暴露于氢化硅气体的同时,导致硅材料的温度差减小。通过使用具有温度上升周期,在其至少一部分中存在H 2环境的温度稳态周期以及在其至少一部分中存在温度下降周期的温度周期的热循环来实现该实施例。存在稀的氢化硅气体。第二实施例公开了一种通过在包含H 2的环境中增加电容器板的温度,在至少一个由硅材料制成的电容器板上形成半球形晶粒硅表面的方法。在存在臭氧气体,氢氟酸氢硅酸氢蒸气和氢气的情况下,使用紫外线将电容器极板的硅材料表面暴露于清洁气体(如GeH.4,NF.3)中。 2);在使电容器板暴露于氢化硅气体的同时降低电容器板的温度。

著录项

  • 公开/公告号US5913127A

    专利类型

  • 公开/公告日1999-06-15

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US19970842302

  • 发明设计人 RANDHIR P. S. THAKUR;CHARLES H. DENNISON;

    申请日1997-04-23

  • 分类号H01L21/20;H01L21/8242;

  • 国家 US

  • 入库时间 2022-08-22 02:07:59

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