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OPTICAL TOMOGRAPHY BASED ON SPECTRUM INTERFERENCE AND OPTICAL SURFACE PROFILE MEASURING APPARATUS

机译:基于光谱干扰和光学表面轮廓测量装置的光学层析成像

摘要

PROBLEM TO BE SOLVED: To enable optical surface profile measurement and optical section image photographing to transparent, translucent and opaque objects, by using an interferometer analyzing the intensity of a light appearing by interference of a luminous flux from a measuring arm and a reference arm, with a spectroscope. ;SOLUTION: A light outputted from a light source 1 is divided into a measurement light 3 and a reference light 4 by a beam splitter 2. The measurement light 3 is turned toward a lens 6 by a rotary mirror 5 and converged in an object 7 to be measured. A reflected light returns to the beam splitter 2, and travels toward an interferometer outlet where a spectrophotometer constituted of a dispersion prism 3, a spectroscope 9 and a detection array 10 is installed. The spectrophotometer records the intensity of a light reflected from the whole irradiation body deep part at a light position X, with a function of wavelength excluding the reference light. By moving a reference mirror 11 along the optical axis with a piezoelectric adjusting unit 12, phase measurement is enabled while using discontinuous adjusting function of the reference mirror 11.;COPYRIGHT: (C)1999,JPO
机译:解决的问题:通过使用干涉仪分析来自测量臂和参考臂的光通量的干扰而出现的光的强度,以实现对透明,半透明和不透明物体的光学表面轮廓测量和光学截面图像拍摄,用分光镜;解决方案:从光源1发出的光通过分束器2分为测量光3和参考光4。测量光3由旋转镜5转向透镜6并会聚在物体7中待测。反射的光返回到分束器2,并朝着干涉仪出口行进,在该出口处安装了由色散棱镜3,分光镜9和检测阵列10构成的分光光度计。分光光度计记录在光位置X处从整个照射体深部反射的光的强度,该光的强度具有除参考光之外的波长的函数。通过使用压电调节单元12使参考镜11沿光轴移动,可以在使用参考镜11的不连续调节功能的同时进行相位测量; COPYRIGHT:(C)1999,JPO

著录项

  • 公开/公告号JPH11325849A

    专利类型

  • 公开/公告日1999-11-26

    原文格式PDF

  • 申请/专利权人 CARL ZEISS JENA GMBH;

    申请/专利号JP19990082817

  • 发明设计人 FERCHER ADOLF FRIEDRICH DR;

    申请日1999-03-26

  • 分类号G01B11/24;G01B9/02;G01J3/45;

  • 国家 JP

  • 入库时间 2022-08-22 02:02:40

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