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SAMPLE PREPARATION BY MICROTOME AND MICROTOME

机译:显微切片法和显微切片法制备样品

摘要

PROBLEM TO BE SOLVED: To adjust the attitude of a sample block with high precision relative to the traveling level of a cutter when a sample block is sliced with a microtome for preparation of a thin sample. ;SOLUTION: A sample block 10 is retained on a stage 15, and a cutter travels above the stage 15. The stage 15 is supported so as to be capable of tilting around two axes which passes by the center of an illustration of the surface of the sample block 10 and are orthogonal to each other. A tool reference plane 31 is formed which is in parallel to the traveling level of the cutting edge of the cutter. The sample block 10 formed with a flat surface in advance is set on the stage 15. The surface is pushed against the tool reference plane 31 for adjustment of the tilting angle of the stage 15 so that the surface may be in parallel to the tool reference plane 31 and, in this condition, the tilting of the stage 15 is clamped. After the distance of the surface from the traveling level is adjusted, the cutter is traveled to slice the surface of the sample block 10.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:当用切片机将样品块切成薄片以制备稀薄的样品时,相对于刀具的行进高度来高精度地调整样品块的姿态。 ;解决方案:将样品块10固定在工作台15上,并在工作台15上方移动切刀。工作台15被支撑为能够绕通过轴表面图示中心的两个轴倾斜。样本块10彼此正交。形成工具基准平面31,该工具基准平面平行于刀具的切削刃的行进高度。预先形成有平坦表面的样品块10被放置在平台15上。该表面被推向工具基准平面31以调节平台15的倾斜角度,使得该表面可以平行于工具基准。平面31,并在这种情况下,平台15的倾斜被夹紧。调整表面到移动高度的距离后,移动切割器以切片样品块10的表面。版权所有:(C)2000,JPO

著录项

  • 公开/公告号JP2000271895A

    专利类型

  • 公开/公告日2000-10-03

    原文格式PDF

  • 申请/专利权人 TOSHIBA MACH CO LTD;

    申请/专利号JP19990077920

  • 发明设计人 KOKUBO MITSUNORI;SERIZAWA SHOGO;

    申请日1999-03-23

  • 分类号B26D3/28;B26D7/01;B26D7/27;

  • 国家 JP

  • 入库时间 2022-08-22 02:01:09

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