首页>
外国专利>
SAMPLE PREPARATION BY MICROTOME AND MICROTOME
SAMPLE PREPARATION BY MICROTOME AND MICROTOME
展开▼
机译:显微切片法和显微切片法制备样品
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To adjust the attitude of a sample block with high precision relative to the traveling level of a cutter when a sample block is sliced with a microtome for preparation of a thin sample. ;SOLUTION: A sample block 10 is retained on a stage 15, and a cutter travels above the stage 15. The stage 15 is supported so as to be capable of tilting around two axes which passes by the center of an illustration of the surface of the sample block 10 and are orthogonal to each other. A tool reference plane 31 is formed which is in parallel to the traveling level of the cutting edge of the cutter. The sample block 10 formed with a flat surface in advance is set on the stage 15. The surface is pushed against the tool reference plane 31 for adjustment of the tilting angle of the stage 15 so that the surface may be in parallel to the tool reference plane 31 and, in this condition, the tilting of the stage 15 is clamped. After the distance of the surface from the traveling level is adjusted, the cutter is traveled to slice the surface of the sample block 10.;COPYRIGHT: (C)2000,JPO
展开▼