首页> 外国专利> SEMICONDUCTOR DEVICE HAVING QUANTUM WAVE INTERFERENCE LAYER AND METHOD OF DESIGNING QUANTUM WAVE INTERFERENCE LAYER CONSTITUTING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE HAVING QUANTUM WAVE INTERFERENCE LAYER AND METHOD OF DESIGNING QUANTUM WAVE INTERFERENCE LAYER CONSTITUTING SEMICONDUCTOR DEVICE

机译:具有量子波干涉层的半导体器件和设计构成半导体器件的量子波干涉层的方法

摘要

PROBLEM TO BE SOLVED: To make a quantum wave interference layer functioning as a carrier reflection layer having a high reflectivity by determining the thicknesses of a first and second layers of the quantum wave interference layer functioning so that the emitted light intensity of a light emitting element having the quan tum wave interference layer is near a max. value.;SOLUTION: On a substrate 10 a buffer layer 12, an n-type contact layer 14, an n-type clad layer 16, a light emitting layer 18 and an electron reflective layer 20 to be a quantum wave interference layer are formed in this order. The electron reflective layer 20 has a 15-period multilayer quantum structure composed of a first p-GaInP layer W and a second p-AlInP layer B with a p-AlGaInP δ layer formed at the boundary of the first and second layers W, B. After examining the relation between the thicknesses of the first and second layers W, B and the light emitting power, it results that when the first and second layers W, B are 5 nm and 7 nm thick, the light emitting power is max.;COPYRIGHT: (C)2000,JPO
机译:要解决的问题:通过确定量子波干涉层的第一和第二层的厚度以使发光元件的发射光强度起作用,来使量子波干涉层用作具有高反射率的载流子反射层。具有量子波干涉层的层接近最大值。 SOLUTION:在基板10上形成缓冲层12,n型接触层14,n型覆盖层16,发光层18和将成为量子波干涉层的电子反射层20。按此顺序。电子反射层20具有由第一p-GaInP层W和第二p-AlInP层B构成的15周期的多层量子结构,在第一和第二层W,B的边界处形成有p-AlGaInPδ层。在检查了第一和第二层W,B的厚度与发光功率之间的关系之后,得出的结果是,当第一和第二层W,B的厚度为5nm和7nm时,发光功率最大。 ;版权:(C)2000,日本特许厅

著录项

  • 公开/公告号JP2000114601A

    专利类型

  • 公开/公告日2000-04-21

    原文格式PDF

  • 申请/专利权人 CANARE ELECTRIC CO LTD;

    申请/专利号JP19990315707

  • 发明设计人 KANO HIROYUKI;

    申请日1997-04-25

  • 分类号H01L33/00;H01L29/06;H01L29/78;H01L31/02;H01L31/04;H01S5/20;

  • 国家 JP

  • 入库时间 2022-08-22 02:00:48

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