首页> 外国专利> METHOD OF EXTRACTING HIGH PRECISION MOSFET MODEL FOR DESIGNING ANALOG CIRCUIT

METHOD OF EXTRACTING HIGH PRECISION MOSFET MODEL FOR DESIGNING ANALOG CIRCUIT

机译:用于设计模拟电路的高精度MOSFET模型的提取方法。

摘要

PROBLEM TO BE SOLVED: To automatically set a minimum value of a gate voltage VGS at measuring VDS-IDS characteristic to make a current value to a required minimum value or more, so as not to set a current value smaller than is necessary at a measurement of VDS-IDS characteristic with an extracted MOSFET element model parameter, and to uniquely determine a model of ISIDIB to conform the model to an actual device. ;SOLUTION: Through calculation of a gate voltage value giving a minimum current value and a maximum current value between a drain and a source specified by figures, a voltage characteristic between a drain and a source, and a current characteristic between the drain and the source are obtained excluded by micro drain-source current to make errors in an analog circuit design simulation to an attributed value or less. A model parameter of a source current is determined, and a model parameter of a wafer current is determined to use a modeling method of extracting a source current, a wafer current, and a drain current.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:在测量VDS-IDS特性时自动设置栅极电压VGS的最小值,以使电流值等于或大于所需的最小值,以使电流值不小于测量所需的值利用提取的MOSFET元件模型参数确定VDS-IDS特性,并唯一确定ISIDIB的模型以使该模型与实际器件相符。 ;解决方案:通过计算栅极电压值(给出由数字指定的漏极和源极之间的最小电流值和最大电流值),漏极和源极之间的电压特性以及漏极和源极之间的电流特性除去微漏源电流,就获得了小于等于1μm的电阻,从而使模拟电路设计仿真中的误差小于或等于属性值。确定源电流的模型参数,并确定晶片电流的模型参数,以使用提取源电流,晶片电流和漏极电流的建模方法。COPYRIGHT:(C)2000,JPO

著录项

  • 公开/公告号JP2000216379A

    专利类型

  • 公开/公告日2000-08-04

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP19990012972

  • 发明设计人 KITAO KATSUYUKI;

    申请日1999-01-21

  • 分类号H01L29/78;H01L21/336;G01R31/316;G01R31/28;H01L29/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:59:12

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