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SOCKET APPARATUS PARTICULARLY ADAPTED FOR BGA TYPE SEMICONDUCTOR DEVICES

机译:特别适用于BGA型半导体器件的插座装置

摘要

A socket (1) for removably receiving semiconductor devices (8) for testingpurposes has film contacts (81) each having a continuous or discontinuousannulus (71, 73, 76, 78) that has been formed on a film substrate and with arecess (72, 74, 77, 79) formed within the annulus exposed at a bottom of aseating or accommodating portion (31). When a BGA type semiconductor device(8) is received in the accommodating part (31) and a cover (16) is closed,electrically conductive balls (9) on the bottom of the semiconductor device (8) arepressed against respective film annular contacts (81, 82, 83, 84) therebyeffecting an electric connection. Since the bottom most portion of the electricallyconductive balls (9) are located within the recesses of the annular contacts, theywill not be deformed. Since the film contacts (81) are prepared by etching andplating, the pitch can be easily narrowed, or otherwise modified.
机译:用于可移除地容纳用于测试的半导体器件(8)的插座(1)目的是具有每个连续或不连续的薄膜触点(81)环(71、73、76、78)已形成在薄膜基材上并带有形成在环底部露出的环形空间内的凹槽(72、74、77、79)座或容纳部分(31)。当BGA型半导体器件(8)被容纳在容纳部(31)中,并且盖(16)被关闭,半导体器件(8)底部的导电球(9)压在相应的薄膜环形触点(81、82、83、84)上实现电连接。由于电的最底部导电球(9)位于环形触点的凹槽内,它们不会变形。由于膜触点(81)是通过蚀刻和电镀时,间距可以很容易地变窄,或以其他方式改变。

著录项

  • 公开/公告号SG75897A1

    专利类型

  • 公开/公告日2000-10-24

    原文格式PDF

  • 申请/专利权人 TEXAS INSTRUMENTS INCORPORATED;

    申请/专利号SG19980004930

  • 发明设计人 KIYOKAZU IKEYA;

    申请日1998-11-23

  • 分类号H01R12/04;H01R33/76;

  • 国家 SG

  • 入库时间 2022-08-22 01:54:41

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