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SILICON-ON-INSULATOR STRUCTURE FOR VERY LARGE-SCALE INTEGRATED CIRCUITS (DESIGN VERSIONS)

机译:大型集成电路(设计版本)的绝缘体上硅结构

摘要

FIELD: microelectronics. SUBSTANCE: structure incorporating first and second silicon layers, insulating layer, metal silicide layer in-between, regions isolated by second insulating layer in silicon layer designed for carrying components of very large-scale integrated circuit, and field-effect transistors in isolated silicon regions has its silicide metal layer and its isolated silicon regions above silicide metal layer carrying both field-effect and bipolar transistors, mentioned metal silicide layer being used as latent low-resistance layer contacting substrate of field-effect transistors and collector region of bipolar transistors. Mentioned bipolar transistors have emitter, base, and collector regions with respective contacts and metal silicide layer used as latent low-resistance layer in collector region as well as local highly doped regions whose collector polarity of conductivity between base and silicide metal layer and between contacts to collector region and silicide layer ensures resistive contact to metal silicide layer. EFFECT: improved design of silicon-on-insulator structure. 7 cl, 4 dwg
机译:领域:微电子学。物质:包含第一和第二硅层,绝缘层,介于两者之间的金属硅化物层,硅层中被第二绝缘层隔离的区域的结构,该区域设计用于承载超大规模集成电路的组件,并且在隔离的硅区域中包含场效应晶体管其硅化物金属层和在硅化物金属层上方的隔离的硅区域同时载有场效应晶体管和双极晶体管,其中提到的金属硅化物层被用作与场效应晶体管的衬底和双极晶体管的集电极区域接触的潜在的低电阻层。提及的双极晶体管具有发射极,基极和集电极区域,其具有各自的触点,并且金属硅化物层用作集电极区域中的潜在低电阻层,以及局部高掺杂区域,其局部高掺杂区域的集电极极性在基极和硅化物金属层之间以及与触点之间集电极区和硅化物层确保与金属硅化物层的电阻接触。效果:改进了绝缘体上硅结构的设计。 7厘升,4载重吨

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