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method of determining the parameters of the boundary conditions at the semiconductor insulator structures.

机译:确定半导体绝缘体结构的边界条件的参数的方法。

摘要

method of determining the parameters of the boundary conditions at the semiconductor insulator tir structures, including a lodge at the u0438u0441u0441u043bu0435u0434u0443u0435u043cu0443u044e structure the tour, which is at a temperature t, pressure to limit the boundary conditions of the charge carriers, and u043eu0431u0435u0434u043d u044fu044eu0449u0435u0433u043e voltagethe heating structure after the relaxation current with a constant speed u03b2 while maintaining high capacity of structure and the temperature z u0438u0441u0438u043cu043eu0441u0442u0438 arising u043du0435u0440u0430u0432u043du043eu0432u0435u0441u043du043eu0433u043e current j (t), and the fact that, in order to improve the accuracy of determining the parameters in their dependence of j (t) define u0435u043bu0438u0447u0438u043du0443 energy efrom the empty and filled with the temperature Tu043fu043eu0433u0440u0430u043du0438u0447u043du044bu0435 state, cooled to the initial temperature t structure, set up the tension so you identities in which the position of the fermi level Fu043du0430 section as well as eafter the relaxation of current re heating structure with a constant speed while maintaining its high capacity u03b2 permanence and filming u0442u0435u043cu043fu0435u0440u0430u0442u0443u0440u043d the dependence of equilibrium. under the current j,establish the correspondence between the number of u0442u043eu0447u0435u043au043du0430 scale temperature dependence of j (t ') and a number of u0442u043eu0447u0435u043au043du0430 scale temperatures (j (t') of the u0441u043eu043eu0442u043du043eu0448u0435u043du0438u044fu0438 find dependence u0441u0435u0447u0435u043d and capture of energy Eu043fu043e u0444u043eu0440u043cu0443u043bu0435u0433u0434u0435; n is the effective density of states in the n - conductivity; concentration of shallow donors; q is the charge of the electron. u03a6 - surface potential act as,ensuring the equality of Fu0438 Eu043fu0440u0438 t; v is the thermal velocity of major carriers charge, k is the boltzmann constant.
机译:确定半导体绝缘体Tir结构边界条件参数的方法,包括在 u0438 u0441 u0441 u0441 u043b u0435 u0434 u0443 u0435 u043c u0443 u044e结构处的停滞处温度t,限制电荷载流子边界条件的压力,以及电压,以恒定速度的松弛电流作用后的加热结构。 u03b2,同时保持结构的高容量和温度z u0438 u0441 u0438 u043c u043e u0441 u0441 u0442 u0438产生了 u043d u0435 u0440 u0430 u0432 u043d u043e u043e u0432 u0432 u0435 u0441 u043d u043e u0433 u043e当前j(t),以及为了提高确定依赖于j(t)的参数的精度而定义 u0435 u043b u0438 u0447 u0438 u043d u0443的事实来自空的能量e,充满温度T u043f u043e u0433 u0440 u0430 u043d u0438 u0447 u043d u044b u0435状态o初始温度t结构,设置张力,以便确定费米能级F u043d u0430的位置,以及在以恒定速度松弛电流再加热结构之后,同时保持其高容量 u03b2持久性和拍摄 u0442 u0435 u043c u043f u0435 u0440 u0430 u0442 u0443 u0440 u043d是平衡的依存关系。在当前j下,建立j的 u0442 u043e u0447 u0435 u043a u043d u0430标度温度依存性与 u0442 u043e u0447 u0435 u043a u043d u0430 u0441 u043e u043e u0442 u043d u043e u0448 u0435 u043d u0438 u044f u0438的标度温度(j(t'))找到相关性 u0441 u0435 u0447 u043f u0435能量捕获E u043f u043e u0444 u043e u0440 u043c u0443 u043b u0435 u0433 u0434 u0435; n是n中的有效态密度-电导率;浅施主的浓度; q是 u03a6-表面电势充当,确保等式F = v是主要载流子电荷的热速度,k是博兹曼常数。

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