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Schlieren measuring process detects changes in turbulent atmospheric flow, aerodynamic, chemical processing and environmental pollution

机译:Schlieren测量过程可检测湍流,空气动力学,化学处理和环境污染的变化

摘要

A Schlieren measuring process monitors the three-dimensional distribution of density and material of phase objects which interrupt radiated patterns. The resultant signals are visualized, and use in measurement, regulation, control and test processes. In the process, light is emitted from a structure, self-illuminating source or a light-scattering background, and passes through a phase substance along a main axis. Light is scattered in two directions transverse to the main axis. Small sections of the transverse images are compared with each other by super-imposition.
机译:Schlieren测量过程监视中断辐射图样的相对象的密度和材料的三维分布。结果信号可视化,并用于测量,调节,控制和测试过程。在该过程中,光从结构,自发光源或光散射背景发出,并沿主轴穿过相物质。光在垂直于主轴线的两个方向上散射。横向图像的一小部分通过叠加进行比较。

著录项

  • 公开/公告号DE19942856A1

    专利类型

  • 公开/公告日2000-06-21

    原文格式PDF

  • 申请/专利权人 MEIER GERD E. A.;

    申请/专利号DE1999142856

  • 发明设计人 MEIER GERD E. A.;

    申请日1999-09-08

  • 分类号G01N21/49;G01B11/00;

  • 国家 DE

  • 入库时间 2022-08-22 01:42:04

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