首页> 外国专利> Copper connection film, e.g. for an ultra large scale integration, is produced by high pressure grain growth heat treatment of a deposited film while suppressing pore formation

Copper connection film, e.g. for an ultra large scale integration, is produced by high pressure grain growth heat treatment of a deposited film while suppressing pore formation

机译:铜连接膜,例如通过在抑制气孔形成的同时对沉积膜进行高压晶粒生长热处理来生产超大规模集成

摘要

Copper connection film production, involves high pressure grain growth heat treatment of a deposited film while suppressing pore formation. A copper or copper alloy connection film, covering an insulating film on a substrate and filling a substrate hole or groove, is formed by: (a) depositing the copper (alloy) by plating or chemical vapor deposition (CVD) within the hole or groove and on the surface of either a barrier layer on the insulating film or a seeding layer on the barrier layer; and (b) heating the entire substrate body in a gas atmosphere under high pressure to cause grain growth in the copper (alloy) while suppressing pore formation, so that the entire substrate surface and the hole or groove interior are covered with a pore-free copper (alloy) film.
机译:铜连接膜的生产涉及在抑制孔形成的同时对沉积膜进行高压晶粒生长热处理。通过覆盖在基板上的绝缘膜并填充基板孔或凹槽的铜或铜合金连接膜,可以通过以下步骤形成:(a)通过电镀或化学气相沉积(CVD)在孔或凹槽内沉积铜(合金)在绝缘膜上的阻挡层或在阻挡层上的籽晶层的表面上; (b)在高压下在气体气氛中加热整个基板本体,从而在抑制孔隙形成的同时使铜(合金)中的晶粒长大,从而整个基板表面和孔或凹槽内部被无孔覆盖。铜(合金)膜。

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