首页> 外国专利> Thickness calibration and shadow correction for automatic X-ray inspection unit with calibration sheet of known thickness and X-ray absorption placed under object of unknown thickness and absorption

Thickness calibration and shadow correction for automatic X-ray inspection unit with calibration sheet of known thickness and X-ray absorption placed under object of unknown thickness and absorption

机译:自动X射线检查装置的厚度校准和阴影校正,将已知厚度的校准片和X射线吸收放置在厚度和吸收率未知的物体下

摘要

The calibration sheet (320) has a known thickness (t2) and absorbs a known percentage of the X-rays (330) passing through it. It may be made of copper or plastics material. A test piece (310) is placed on top of the calibration sheet. It may be of a different thickness (t1) and may consist of soldered goods, with a variable absorption of X-rays. The X-ray machine may be of the scanning laminography or tomography type, giving a clear image of one plane in the test piece.
机译:校准片(320)具有已知的厚度(t2),并吸收通过其的已知百分比的X射线(330)。它可以由铜或塑料制成。将测试片(310)放置在校准片的顶部。它可能具有不同的厚度(t1),并且可能由具有可变吸收X射线的焊接物品组成。 X射线机可以是扫描X线摄影或X线断层摄影的类型,从而在测试件中给出一个平面的清晰图像。

著录项

  • 公开/公告号DE19951793A1

    专利类型

  • 公开/公告日2000-08-10

    原文格式PDF

  • 申请/专利权人 HEWLETT-PACKARD CO. PALO ALTO;

    申请/专利号DE19991051793

  • 发明设计人 HEUMANN JOHN M.;

    申请日1999-10-27

  • 分类号G01N23/06;

  • 国家 DE

  • 入库时间 2022-08-22 01:41:56

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号