Semiconductor test system for mixed signal integrated circuits with continuous analog - digital conversion of analog test signal responses

摘要

One unit tests the digital function of an integrated circuit with a logic test pattern and evaluates the response signal. A second unit provides an analog signal to test its analog function. The analog response signals are converted into digital signals, the wave forms of which are repeated for a number of cycles in a set period. The sampling pulse for the analog signal is phase displaced by a set value and the converted signals stored at a specific address of a store. A synchronizing unit synchronizes the operations of the test units