Test and personalization of integrated circuits used in smart cards has memory accessible in reading to the test processor, a decoder, storage for personalization key and a device to encode

摘要

The integrated circuit test station (STST) has a memory (SMEM) accessible in reading to the test processor, a decoder (DCD2) for a personalization key that has been encoded with a session key (RK), a storage (KREG1) for the personalization key, and a device (CD1) to encode, using the personalization key, personalization data (PDk) delivered by the test processor.