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Metal semiconductor FET having doped A1GaAs layer between channel layer and A1GaAs buffer layer

机译:在沟道层和AlGaAs缓冲层之间具有掺杂AlGaAs层的金属半导体FET

摘要

A metal-semiconductor field effect transistor includes an AlGaAs buffer layer made of Al.sub.x Ga.sub.1-x As, wherein 0 x 0.4, and a channel layer made of an n-type doped In.sub.y Ga.sub.1-y As, wherein 0 y 0.4, having a thickness equal to or less than a critical thickness for lattice-matching with GaAs. Further, a doped AlGaAs layer is interposed between the AlGaAs buffer layer and the channel layer. The doped AlGaAs layer is made of Al.sub.x Ga.sub.1-x As, wherein 0 x 0.4, is doped with Si of a concentration of 5*10. sup. 17 cm.sup.-3 or more, and has a thickness which is sufficient to provide a barrier against holes caused by a donor depletion region.
机译:金属半导体场效应晶体管包括由Al x Ga 1-x As制成的AlGaAs缓冲层,其中0 <x <0.4,以及由n型掺杂In制成的沟道层。 y Ga 1-y As,其中0

著录项

  • 公开/公告号US6037615A

    专利类型

  • 公开/公告日2000-03-14

    原文格式PDF

  • 申请/专利权人 OKI ELECTRIC INDUSTRY CO. LTD.;

    申请/专利号US19980083934

  • 发明设计人 SEIJI NISHI;ISAMU MATSUYAMA;

    申请日1998-05-26

  • 分类号H01L31/0328;H01L31/0336;H01L31/072;

  • 国家 US

  • 入库时间 2022-08-22 01:37:35

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