首页> 外国专利> Semiconductor systems utilizing materials that form rectifying junctions in both N and P-type doping regions, whether metallurgically or field induced, and methods of use

Semiconductor systems utilizing materials that form rectifying junctions in both N and P-type doping regions, whether metallurgically or field induced, and methods of use

机译:利用在冶金和场致的N型和P型掺杂区均形成整流结的材料的半导体系统及其使用方法

摘要

Disclosed are semiconductor systems, such as integrated circuits utilizing Schotky barrier and/or diffused junction technology, which semiconductor systems incorporate material(s) that form rectifying junctions in both metallurgically and/or field induced N and P-type doping regions, and methods of their use. Disclosed are Schottky barrier based inverting and non-inverting gate voltage channel induced semiconductor single devices with operating characteristics similar to multiple device CMOS systems and which can be operated as modulators, N and P-channel MOSFETS and CMOS formed therefrom, and (MOS) gate voltage controlled rectification direction and gate voltage controlled switching devices, and use of such material(s) to block parasitic current flow pathways. Simple demonstrative five mask fabrication procedures for inverting and non-inverting gate voltage channel induced semiconductor single devices with operating characteristics similar to multiple device CMOS systems are also presented.
机译:公开了诸如利用肖特基势垒和/或扩散结技术的集成电路之类的半导体系统,该半导体系统在冶金和/或场致N和P型掺杂区中结合了形成整流结的一种或多种材料,以及他们的使用。公开了基于肖特基势垒的反相和同相栅极电压通道感应的半导体单器件,其具有与多器件CMOS系统相似的工作特性,并且可以用作调制器,由其形成的N沟道P沟道MOSFET和CMOS,以及(MOS)栅极电压控制的整流方向和栅极电压控制的开关器件,以及使用此类材料来阻挡寄生电流流动路径。还介绍了用于具有与多器件CMOS系统相似的工作特性的反相和同相栅极电压通道感应的半导体单个器件的简单说明性五个掩模制造程序。

著录项

  • 公开/公告号US6091128A

    专利类型

  • 公开/公告日2000-07-18

    原文格式PDF

  • 申请/专利权人 WELCH;JAMES D.;

    申请/专利号US19980033695

  • 发明设计人 JAMES D. WELCH;

    申请日1998-03-03

  • 分类号H01L27/095;H01L29/47;

  • 国家 US

  • 入库时间 2022-08-22 01:36:38

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