首页> 外国专利> Two-dimensional position/orientation measuring mark, two- dimensional position/orientation measuring method and apparatus, control apparatus for image recording apparatus, and control apparatus for manipulator

Two-dimensional position/orientation measuring mark, two- dimensional position/orientation measuring method and apparatus, control apparatus for image recording apparatus, and control apparatus for manipulator

机译:二维位置/姿势测量标记,二维位置/姿势测量方法和设备,图像记录设备的控制设备和操纵器的控制设备

摘要

A mark is provided on an object surface of an object under measurement, and the mark provides two intersection points P.sub.1 and P. sub.2 between first and second straight lines L.sub.1, L.sub.2, and between second and third lines L.sub.2, L.sub.3, in which an angle ". alpha." defined by the first and second straight lines L.sub.1 and L.sub. 2, another angle "" defined by the second and third straight lines L. sub.2 and L.sub.3, and a distance between P.sub.1 and P.sub.2 are known. This mark is imaged on at least one set of one-dimensional optical sensor. When a sensor signal having a light intensity distribution along a longitudinal direction is outputted from the one- directional optical sensor, a calculation unit calculates positions of the straight lines L. sub.1 to L.sub.3 of the mark image on the one- dimensional optical sensor in response to the sensor signal. Based upon this calculation result, another calculation is made of at least one position of the two intersection points P.sub.1 and P.sub.2, and also an inclination of at least one straight line among the straight lines L.sub. 1 to L.sub.3. For instance, this calculation result is used as a reference point for measuring the position of the object under measurement, and also a reference line for measuring the orientation thereof.
机译:在被测物体的物体表面上设置标记,该标记在第一直线L 1和第二直线L 2之间提供两个交点P 1和P 2。在第二和第三线L2,L3之间,其中角度为“α”。由第一直线L 1和第二直线L L限定。在图2中,由第二和第三直线L 2和L 3限定的另一个角度“”,以及P 1和P 2之间的距离是已知的。该标记被成像在至少一组一维光学传感器上。当从单向光学传感器输出具有沿纵向方向的光强度分布的传感器信号时,计算单元计算标记图像在其上的直线L.sub.1至L.3的位置。 -响应传感器信号的三维光学传感器。基于该计算结果,对两个交点P 1和P 2的至少一个位置以及直线L中的至少一条直线的倾斜度进行另一种计算。 1至L.sub.3。例如,该计算结果用作用于测量被测物体的位置的参考点,以及用于测量其取向的参考线。

著录项

  • 公开/公告号US6115136A

    专利类型

  • 公开/公告日2000-09-05

    原文格式PDF

  • 申请/专利权人 FUJI XEROX CO. LTD.;

    申请/专利号US19980167724

  • 发明设计人 KAZUYUKI TSUKAMOTO;RYUZO OKADA;

    申请日1998-10-07

  • 分类号G06K15/00;

  • 国家 US

  • 入库时间 2022-08-22 01:36:15

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